Materials Science

X-Ray Diffraction for Materials Research
From Fundamentals to Applications

Myeongkyu Lee, PhD

X-Ray Diffraction for Materials Research

Published. Available now.
Pub Date: March 2016
Hardback Price: see ordering info
Hard ISBN: 9781771882989
Paperback ISBN: 978-1-77463-593-3
E-Book ISBN: 9781771882996
Pages: 302pp with index
Binding Type: Hardback
Notes: 219 illustrations


Reviews
“This book is a HIGHLY ACCESSIBLE INTRODUCTION to XRD for materials research. It is written in concise and clear prose. The text creates a cohesive picture of XRD. After finishing this book, researchers will be able to understand the basics of many materials science and engineering research papers. . . . X-ray diffraction (XRD) is a powerful nondestructive characterization technique for determining the structure, phase, composition, and strain in materials. It is one of the most frequently employed methods for characterizing materials. This book distinguishes itself from other books on this topic by its simplified treatment and its coverage of thin-film analysis. It largely minimizes the mathematics and is profusely illustrated, making it a good entry point for learning the basic principles of XRD. The common thin-film structures (random polycrystalline, textured) and their relationships with the substrate (strain, in-plane rotation) are defined and explained. This makes it valuable to researchers who study thin-film deposition. The book includes example problems to reinforce the concepts covered, plus problems that can be assigned as homework.”
—Review by J.H. Edgar of the Department of Chemical Engineering, Kansas State University, USA, for MRS BULLETIN, February 2017

“Beginners in materials science, physics or chemistry who are interested in understanding the basics in crystallography and X-ray diffraction are definitively the target readers of this book. The aim of the author to introduce crystallography and X-ray diffraction to those completely novice in the field is certainly reached, with a concern for simplicity that will delight those who are frightened by the rigorous formalism. . . . This book is aimed at all those who do not have any background in crystallography and optics and wish to approach the basic notions in crystallography and X-ray diffraction in the simplest way. All the fundamental concepts are presented using only elementary knowledge in mathematics. The text is illustrated by a lot of examples and clear figures. Exercises are also proposed, with solutions for some.”
— Acta Crystallographica Section A: Foundations and Advances,
Review by Pierre Fertey, Division Experiences, Synchrotron SOLEIL, France


Now Available in Paperback


X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 3 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders.

The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also
  • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics
  • covers the practical applications as well as the underlying principle of X-ray diffraction
  • presents appropriate examples with answers to help readers understand the contents more easily
  • includes thin film characterization by X-ray diffraction with relevant experimental techniques
  • presents a huge number of elaborately drawn graphics to help illustrate the content
The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition.

Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis.

This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.

CONTENTS:
Preface
Part I: X-Rays and Crystal Geometry
1. Electromagnetic Waves and X-Rays
2. Geometry of Crystals
3. Interference and Diffraction

Part II: Theory of X-Ray Diffraction
4. Directions of X-Ray Diffraction
5. Intensities of X-Ray Diffraction

Part III: Applications of X-Ray Diffraction
6. Characterization of Thin Films by X-Ray Diffraction
7. Laue Method And Determination of Single Crystal Orientation
8. Powder Diffraction
Index


About the Authors / Editors:
Myeongkyu Lee, PhD
Professor, Department of Materials Science and Engineering, Yonsei University, Korea

Myeongkyu Lee, PhD, is a Professor in the Department of Materials Science and Engineering at Yonsei University in Seoul, Korea. He received the “Best Teacher Award” from Yonsei University in 2006, and he has received best paper awards from the European Materials Research Society, the 10th IEEE Conference on Nanotechnology, and the American Conference on Crystal Growth. He teaches courses in crystallography, X-ray diffraction, optical properties of materials, advanced photonic materials, and opto-electronic properties of materials. He received his PhD in materials science and engineering from Stanford University, California, USA.




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